Characterizations and applications of nanomaterials

High-efficiency photo-electron conversion devices

Semiconductor processes and nanofabrication

Characterizations and applications of nanomaterials

Light harvesting and light extraction

Optical analysis techniques

Eco-friendly devices and sensors

Using Optical Anisotropy as a Quality Factor To Rapidly Characterize
Structural Qualities of Large-Area Graphene Films

In this study, we find that the optical anisotropy of graphene films could be used as an alternative quality factor for the rapid characterization of large-area graphene films prepared through chemical vapor deposition. We develop an angle-variable spectroscopic method to rapidly determine the optical anisotropy of graphene films. Unlike approaches using Raman scattering spectroscopy, this optical anisotropy method allows ready characterization of the structural quality of largearea graphene samples without the application of high-intensity laser irradiation or complicated optical setups. Measurements of optical anisotropy also allow us to distinguish graphene samples with different extents of structural imperfections; the results are consistent with those obtained from using Raman scattering spectroscopy. In addition, we also study the properties of graphenebased transparent conductive films at wide incident angles because of the advantage of the optical anisotropic properties of graphene. The transmittance of graphene is much higher than that of indium tin oxide films, especially at large incident angles.